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Our instruments allow for precise imaging and analysis of objects and materials at micrometer scale. These capabilities can support research in materials science, geology, medical science and technology, computer science, failure analysis and forensics.

Instruments

Our instruments are available to researchers and students across Florida via Internet-2, an electronic information pathway connecting us with other major universities in the state. 

  • EPMA

    EPMA is a high-precision probe instrument used to image, identity and chemically analyze extremely small - on the scale of micrometers - objects without chemically altering or physically destroying them. This instrument is used by scientists in many different fields, particularly materials science, geology, medical science and technology, computer science and forensic science.

    EPMA Standards


    JEOL 8900R Superprobe

    • 5 – 2 crystal WDS spectrometers
    • 2 H – (large) type gas flow detectors
    • 3 standard sealed detectors
    • One EDS–UTW detector
    • Unix operating system
    • Both PC and Mac remote operation
    • Elemental analysis from Boron to Uranium
    • Standards available for metals and minerals
    • High accuracy quantitative analysis
    • High accuracy analysis of light elements
    • Supplemental cold trap for trace elements
    • Digital image capture
    • High resolution X-ray mapping
    • Phase diagram
    • CL detector
    • SEI/BEI detectors
    • Remote access worldwide
  • SEM

    SEM is a versatile instrument that is capable of imaging a wide range of materials - from uncoated soft tissues to hard rocks in variable pressure conditions. The SEM is utilized by a diverse user group, from forensics, biomedical engineers, biologists and hard material scientists to geologists and failure analysts.

    JEOL JSM 5900LV

    • High resolution of 3.0 nm
    • Point and click PC interface
    • Auto and manual focus
    • Stage control
    • Dual magnification
    • Multipoint measurement
    • Digital zoom
    • Sample exchange
    • Easily mouse operated
    • Image capture
    • Digital image capture - Polaroid camera available
    • Large chamber and stage
    • 5 axis automation
    • Click-center-of-zoom
    • Automatic low vacuum system
    • Switch between LV and HV with one click
    • Specimen can be held at LV without being subjected to damaging effects of HV
    • EDS-UTW detector
    • CL detector
    • SEI/BEI detectors
  • Carbon Coater

    Electron Microscopy Sciences EMS950X Turbo Pump carbon Coater

  • Sputtercoater

    A SPI-MODULE sputter coater - Au or Au/Pd coating available

  • Critical Point Dryer

    Critical Point Dryer A critical point dryer is an instrument used to dehydrate biological specimens intended to be observed in a Scanning Electron Microscope so that the specimen is preserved in its natural state. Samdri®-PVT-3D

    • Precise flow control for INLET, COOL, PURGE, VENT, and BLEED micro metering valves.
    • Vernier handles on all metering valves allow for reproducible settings.
    • Internal surfaces inert to LCO2 and ultra-pure alcohols.
    • Integrated automatic temperature control.
    • Static pressure control module for automatic pressure stability.
    • EZ top loading process chamber.
    • Internal filtration* protect samples and valves down to 0.5µm.
    • Tough, solvent resistant cabinet.
    • Under-lit chamber with viewing port aids visualization of chamber status.
    • Fast adiabatic chamber cooling* with CO2.
    • Advanced solid state reliable electronics.
    • All electronic and other components meet UL, CE and/or U.S. Military Specifications.

    User Manual for PVT 3-D

Services

Please bring a flash drive for data storage.

MicroscopesAcademicCommercial
OpticalNo ChargeNo Charge
SEM (Local or Remote)$20.00/hr$40.00/hr
EDS$10.00/hr$20.00/hr
EPMA (Local or Remote)$40.00/hr$100.00/hr
Center Operator Assistance add
SEM$20.00/hr$40.00/hr
EPMA$25.00/hr$50.00/hr
Center prep fee$25.00$25.00
Stubs$0.75$1.50
Carbon Tabs$0.10$.015

 

Coatings per sampleAcademicCommercial
Gold$10.00/Min$20.00/Min
Gold/Paladium$10.00/Min$20.00/Min
Carbon$10.00/specimen$20.00/specimen
Critical Point Dryer$20.00/Run$40.00/Run

Publications

Our faculty and students are authors and co-authors on dozens of studies.

FCAEM Publications 

Contact Us 

11200 SW 8th Street, PC 50
Miami, FL 33199
Tel: 305-348-2714
Fax: 3050348-3580

Our facility is located on the ground level, beneath the main exterior stairway on the north side of the Primera Casa building.